Application of gas-phase FTIR and microwave spectroscopy for characterization and determination of impurities in SiF4

Edit Item

General Information:

Citation:

Sennikov, P. , Chuprov, L. A. , Ignatov, S. , Vaks, V. L. , Tokhadze, K. G. and Schrems, O. (2006): Application of gas-phase FTIR and microwave spectroscopy for characterization and determination of impurities in SiF4 , The 25th Conference on Precision Electromagnetic Measurements (CPEM-2006), 9-14 July, Turin, Italy. .

Cite this page as:

hdl:10013/epic.25633

Contact Email:

oschrems@awi-bremerhaven.de

Download:

Supplementary Information:

Abstract:

Further Details:

Item Type:

Conference

Authors:

Sennikov, Peter ; Chuprov, L. A. ; Ignatov, Stanislav ; Vaks, V. L. ; Tokhadze, K. G. ; Schrems, Otto

Divisions:

AWI Organizations > Climate Sciences > Atmospheric Circulations

Programs:

Helmholtz Research Programs > MARCOPOLI (2004-2008) > POL-MARCOPOLI
Helmholtz Research Programs > MARCOPOLI (2004-2008) > POL1-Processes and interactions in the polar climate system

Eprint ID:

15504