SEIK vs. EnKF: On the benefit of higher order sampling and error subspace formulation


Contact
lnerger [ at ] awi-bremerhaven.de

Abstract


Item Type
Conference (Talk)
Authors
Divisions
Programs
Peer revision
Not peer-reviewed
Publication Status
Published
Event Details
EGU 1st General Assembly, Nice, France, April 25 - 30.
Eprint ID
10509
Cite as
Nerger, L. , Hiller, W. and Schröter, J. (2004): SEIK vs. EnKF: On the benefit of higher order sampling and error subspace formulation , EGU 1st General Assembly, Nice, France, April 25 - 30 .


Share

Research Platforms
N/A

Campaigns


Actions
Edit Item Edit Item