SEIK vs. EnKF: On the benefit of higher order sampling and error subspace formulation


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lnerger [ at ] awi-bremerhaven.de

Abstract


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Conference (Talk)
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Published
Event Details
EGU 1st General Assembly, Nice, France, April 25 - 30.
Eprint ID
10509
Cite as
Nerger, L. , Hiller, W. and Schröter, J. (2004): SEIK vs. EnKF: On the benefit of higher order sampling and error subspace formulation , EGU 1st General Assembly, Nice, France, April 25 - 30 .


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