RMS slope of exponentially correlated surface roughness for radar applications


Contact
wdierking [ at ] awi-bremerhaven.de

Abstract


Item Type
Article
Authors
Divisions
Programs
Peer revision
ISI/Scopus peer-reviewed
Publication Status
Published
Eprint ID
6663
Cite as
Dierking, W. (2000): RMS slope of exponentially correlated surface roughness for radar applications , Ieee transactions on geoscience and remote sensing,Vol. 38, No. 3, pp. 1451-1454 .


Share

Research Platforms
N/A

Campaigns


Actions
Edit Item Edit Item