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Items where Author is "Tokhadze, K. G."
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Conference
-Poster
Sennikov, P. , Chuprov, L. A. , Ignatov, S. , Vaks, V. L. , Tokhadze, K. G. and Schrems, O.
(2006)
Application of gas-phase FTIR and microwave spectroscopy for characterization and determination of impurities in SiF4 ,
The 25th Conference on Precision Electromagnetic Measurements (CPEM-2006), 9-14 July, Turin, Italy.
.
hdl:10013/epic.25633
Article
Chuprov, L. A. , Sennikov, P. , Tokhadze, K. G. , Ignatov, S. and Schrems, O.
(2006)
High-resolution Fourier-transform IR spectroscopic determination of impurities in silicon tetrafluoride and silane prepared from it ,
Inorganic materials,
42
(8),
pp. 924-931
.
hdl:10013/epic.25784
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Article
Burtsev, A. P. , Bocharov, V. N. , Ignatov, S. , Kolomiitsova, T. D. , Sennikov, P. , Tokhadze, K. G. , Chuprov, L. A. , Shchepkin, D. N. and Schrems, O.
(2005)
Integral Intensities of Absorption Bands of Silicon Tetrafluoride in the Gas Phase and Cryogenic Solutions: Experiment and Calculation ,
Optics and spectroscopy,
98
(2),
pp. 227-234
.
doi:10.1134/1.1870065
, hdl:10013/epic.23021
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