Items where Author is "Vaks, V. L."

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Conference -Poster
Sennikov, P. , Chuprov, L. A. , Ignatov, S. , Vaks, V. L. , Tokhadze, K. G. and Schrems, O. (2006)
Application of gas-phase FTIR and microwave spectroscopy for characterization and determination of impurities in SiF4 ,
The 25th Conference on Precision Electromagnetic Measurements (CPEM-2006), 9-14 July, Turin, Italy. .
hdl:10013/epic.25633

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